|
|
|
High Resolution Transmission Electron Microscopy (HRTEM)
Description
TEM is used on thin sections of material to determine the distribution of atoms, size and shape of nano- and micron-sized structures. In nanotechnology TEM is specifically used to characterize the structure, morphology, and composition of nanoparticles and other nanoscale materials. In addition, back-scattered X-ray (EDX) is used to map the position of elements in the sample. Through these methods, one can reconstruct an atomic map of the imaged sample. HRTEM, high resolution imaging capability, it is an invaluable tool to study nanoscale properties of crystalline material such as semiconductors and metals. HRTEM has been widely and effectively used for analyzing crystal structures and lattice imperfections in various kinds of advanced materials on an atomic scale.
Specifications
- High resolution imaging
- Equipped with CCD camera
- SAED diffraction
- Single and double specimen holder
- Ultracut UCT/UC6 Ultramicrotomes/FCS Cryostages
Applications
- Particle size and shape analysis
- Particle size distribution
- Determination of crystallographic phases
- Elemental Mapping
For more information on various packages, special rates & discounts, please contact us at sales@allegiancenano.com
|
|
|
|
|
|
|
|
