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Field Emission Scanning Electron Microscopy (FESEM)
Description
SEM rasters a focused electron beam across a sample surface, providing high-resolution and long-depth-of-field images of the sample surface. SEM is one of the most widely used analytical tools in materials industry due to the extremely detailed images it can provide. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. The Energy Dispersive Spectroscopy (EDS) feature allows the additional advantage of being able to obtain the elemental composition of small objects or surfaces. In nanotechnology, SEM is used to determine the consistency of surface featured in manufactured nanomaterials. In addition, backscattered X-rays are used to map elemental features at the surface of the material or for the rapid discrimination of phases in multiphase samples. A field-emission SEM provides narrower probing beams at low as well as high electron energy, resulting in both improved spatial resolution and minimized sample charging and damage. FESEM can be used to analyze nanotechnology based materials such as Diamond films, Carbon nanotubes, Nanoparticles, Semiconductor Cross Sections with low k content, Plastic Electronics, Porous materials, Glass substrates etc.
Specifications
- High resolution
- Energy Dispersive X-ray Analysis
- Backscattered image
- 1.2 nm resolution at 5kV
Applications
- Characterization of size, size distribution, shape and dispersion
- Elemental identification and composition
- Correlation of surface appearance and surface morphology
- 2D, 3D characterization of height and lateral dimensions of nano-objects
- Thickness measurement of thin coatings and films
For more information on various packages, special rates & discounts, please contact us at sales@allegiancenano.com
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