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electron ENERGY LOSS SPECTROSCOPY (EELS)
Description
EELS is used on thin sections of material to determine the
distribution of atoms, size and shape of nano- and micron-sized
structures. In nanotechnology EELS is specifically used to characterize
the structure, morphology, and composition of nanoparticles and other
nanoscale materials. In addition, back-scattered X-ray (EDX) is used to
map the position of elements in the sample. Through these methods, one
can reconstruct an atomic map of the imaged sample. HRTEM, high
resolution imaging capability, it is an invaluable tool to study
nanoscale properties of crystalline material such as semiconductors and
metals. HRTEM has been widely and effectively used for analyzing
crystal structures and lattice imperfections in various kinds of
advanced materials on an atomic scale.
Specifications
- High resolution imaging
- Equipped with CCD camera
- SAED diffraction
- Single and double specimen holder
- Ultracut UCT/UC6 Ultramicrotomes/FCS Cryostages
Applications
- Particle size and shape analysis
- Particle size distribution
- Determination of crystallographic phases
- Elemental Mapping
For more information on various packages, special rates & discounts, please contact us at sales@allegiancenano.com
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