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Atomic Force Microscopy (AFM)
Description
Atomic Force Microscopy (AFM) is an important analytical tool which provides topographic information with resolution down to the angstrom level. AFM uses a physical probe raster scanning across the sample using piezoelectric ceramics. A feedback loop is used to maintain a constant interaction between the probe and the sample. The position of the probe and the feedback signal are electronically recorded to produce a three dimensional map of the surface or other information depending on the specialty probe used. AFM has ability to scan the surface features without damaging sample and it can be done under ambient conditions.
Specifications
- High resolution 3D surface profile
- Sample size 200 mm in diameter and 12 mm in thickness
- Various imaging mode- Contact, Non-contact, Tapping, lateral force, Force modulation, interleave scanning and lift mode
- Fluid contact mode
Applications
- Surface Characterization of thin films
- Elemental identification and composition
- Biomaterials, macromolecules, living organisms
- Lithographic patterns characterization
- Nanofabricated patterns, nanomaterials surface imaging
For more information on various packages, special rates & discounts, please contact us at sales@allegiancenano.com
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